Resumen
The invention relates to an apparatus for measuring chip leakage current and temperature, having an output that varies linearly with temperature. The apparatus includes a leakage inverter and an electronic module which digitises and linearises the nonlinear output of the leakage inverter. The provision of a linear response reduces the requirements in terms of data interconnection and storage, as well as facilitating the digital representation of same. The apparatus can be used to measure temperature variations inside a chip and to measure leakage current variations, which also involves the measurement of static power variations inside a chip.