Reivindicaciones

1. Device for measuring temperature and leakage current in a chip characterized in that it comprises a leakage inverter, which provides a signal, the commutation time of which ,tcon, in a single direction is directly proportional to the leakage current of one of the devices p and n forming it; and one or more electronic modules which digitalize tcon or a time proportional to it, and which apply a mathematical transformation which produces a linear transfer function of the time digitalized with the temperature. 2. Device for measuring temperature and leakage current in a chip, according to claim 1, characterized in that for the digitalization it uses a counter which counts the number of clock cycles of tcon or a time proportional to it; and which for the mathematical transformation which produces a linear transfer function of the time digitalized with the temperature an electronic module is used which carries out the logarithm operation on the counter output. 3. Device for measuring temperature and leakage current in a chip, according to claim 1, characterized in that a single electronic module digitalizes and linearizes, module which consists of a logarithmic counter which carries out a logarithmic count on tcon or a time proportional to it.